KINETIC-STUDY OF WSIX-CVD PROCESSES - A COMPARISON OF WF6 SIH4 AND WF6/SI2H6 REACTION SYSTEMS/

Citation
T. Saito et al., KINETIC-STUDY OF WSIX-CVD PROCESSES - A COMPARISON OF WF6 SIH4 AND WF6/SI2H6 REACTION SYSTEMS/, Electronics & communications in Japan. Part 2, Electronics, 78(10), 1995, pp. 73-84
Citations number
18
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
8756663X
Volume
78
Issue
10
Year of publication
1995
Pages
73 - 84
Database
ISI
SICI code
8756-663X(1995)78:10<73:KOWP-A>2.0.ZU;2-I
Abstract
Kinetic study on chemical vapor deposition Of tungsten silicide (CVD-W Six) by the mixture of WF6/SiH4 or WF6/Si2H6 was made using an externa lly heated tubular reactor. By investigating the effect of the film pr ecipitation area on the gas phase volume ratio(the SN ratio) in film f ormation, it can be concluded that the initial step of film precipitat ion was dominated by radical chain reaction. In addition, a new proces s. to form WSix using preliminary excitation of gas phase reaction at the inlet of the reactor was proposed. Using this process, film compos ition was controlled and the formation of WSi2.5 films with excellent step coverage was realized.