Am. Belu et al., EVALUATION OF MATRIX-ASSISTED LASER-DESORPTION IONIZATION MASS-SPECTROMETRY FOR POLYMER CHARACTERIZATION, Journal of the American Society for Mass Spectrometry, 7(1), 1996, pp. 11-24
A protocol for the preparation of polymeric samples for time-of-flight
matrix-assisted laser desorption ionization mass spectrometry (TOF-MA
LDI-MS) analysis was developed. Dithranol was identified as a good mat
rix for polystyrene (PS), and the addition of silver for cationization
of molecules was determined to be necessary. Based on this preparativ
e method, low molecular weight samples of other polymers [polyisoprene
, polybutadiene, poly(ethylene oxide), poly(methyl methacrylate), and
polydimethylsiloxane] were analyzed with molecular weights up to 49 ku
. The effects of laser intensity were determined to influence the mole
cular weight distribution of intact oligomers, most significantly for
low molecular weight polymers. Linear and reflectron modes of analysis
were evaluated; better signal intensity and resolution were obtained
in the reflectron mode. The TOF-MALDI-MS measurements are compared wit
h time-of-flight secondary ion mass spectrometry (TOF-SIMS) and gel pe
rmeation chromatography (GPC) for same polymers. The M(n) values calcu
lated by TOF-MALDI-MS consistently are higher than values calculated b
y TOF-SIMS for all classes of polymers with molecular weights up to 8
ku. The molecular weights of the PS calculated. from TOF-MALDI-MS are
in good agreement with GPC (+/-10%). The composition of the terminal g
roup on a polymer chain may affect the ion yields. The ion yields of i
ntact oligomers were evaluated as a function of end group composition
for both TOF-MALDI-MS and TOF-SIMS. The slight disparity of results be
tween TOF-SIMS and TOF-MALDI-MS for the perfluoroalkyl-terminated PS s
uggests that the oligomers are desorbed preferentially from the surfac
e in the TOF-SIMS analysis, rather than having an increased ionization
probability.