Experimental results on the ablation of a SiC single crystal in air un
der irradiation with a XeCl excimer laser beam are presented. XPS anal
ysis reveals the Si enrichment of the ablated areas under an energy de
nsity of the laser beam of 1 to 3.5 J/cm(2) and the formation of SiOx
in the ablated areas. The nonstoichiometric ablation of SiC allows one
to activate selectively the SiC surface for metal deposition from an
electroless plating solution. Both Ni and Cu deposits show a good adhe
rence to the SiC surface (up to 0.5 N/mm(2)). Similar results are obse
rved with SiC ceramics with a better adherence of the electroless meta
l deposit. The adherence of the deposit to the ablated SiC samples inc
reases upon HF treatment. (C) 1996 American Institute of Physics.