T. Schmidt et al., PEAK-TO-VALLEY RATIO OF SMALL RESONANT-TUNNELING DIODES WITH VARIOUS BARRIER-THICKNESS ASYMMETRIES, Applied physics letters, 68(6), 1996, pp. 838-840
Resonant tunneling through small double-barrier heterostructures is in
vestigated in dependence of the charge accumulation in the quantum wel
l and the device diameter. The study comprises a series of resonant-tu
nneling diodes with four different barrier-thickness ratios and diamet
ers between 300 nm and 10 mu m. Special emphasis lies on the peak-to-v
alley ratio of the resonant-tunneling current peaks, which drops drast
ically with decreasing device diameter for weak electron accumulation,
while it is size independent in the strong-charging case. (C) 1996 Am
erican Institute of Physics.