Jh. Shin et al., 1 F NOISE CHARACTERISTICS OF ALGAAS/GAAS HETEROJUNCTION BIPOLAR-TRANSISTOR WITH A NOISE CORNER FREQUENCY BELOW 1 KHZ/, IEEE electron device letters, 17(2), 1996, pp. 65-68
To reduce the low-frequency noise, HBT's with a large emitter size of
120 x 120 mu m(2) are fabricated on abrupt emitter-base junction mater
ials without undoped spacer. The HBT's exhibit an internal noise corne
r frequency of 100 Hz, which is much lower than about 100 kHz of conve
ntional AlGaAs/GaAs HBT's, From the very low noise HBT's, the existenc
e of resistance fluctuation 1/f noise is clearly verified by the simpl
e comparison of collector current noise spectra with different base te
rminations. It is found that, at a high emitter-base forward bias, the
resistance fluctuation 1/f noise becomes dominant for shorted base-em
itter termination, but the internal 1/f noise dominant for open base.
Device design rules for low noise small-feature size HBT, including re
sistance fluctuation, are discussed.