THICKNESS VIBRATIONS OF THIN PIEZOELECTRIC PLATES AND THE DETERMINATION OF THE ELECTROELASTIC CONSTANTS OF AL0.88GA0.12PO4 CRYSTAL

Citation
Jf. Wang et al., THICKNESS VIBRATIONS OF THIN PIEZOELECTRIC PLATES AND THE DETERMINATION OF THE ELECTROELASTIC CONSTANTS OF AL0.88GA0.12PO4 CRYSTAL, Journal of applied physics, 79(3), 1996, pp. 1696-1700
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
79
Issue
3
Year of publication
1996
Pages
1696 - 1700
Database
ISI
SICI code
0021-8979(1996)79:3<1696:TVOTPP>2.0.ZU;2-5
Abstract
Thickness vibrations of thin piezoelectric plates excited by perpendic ular or parallel fields have been investigated. In the analyses of the resonances of the thin plates, both the stress boundary and the elect rical conditions have been considered. The theory has been applied to the determination of the electro-elastic constants of a newly develope d piezoelectric crystal, Al0.88Ga0.12PO4. (C) 1996 American Institute of Physics.