THE X-RAY-INVESTIGATION OF THE TERNARY ND-AG-SI SYSTEM

Citation
Ov. Zaplatynsky et al., THE X-RAY-INVESTIGATION OF THE TERNARY ND-AG-SI SYSTEM, Journal of alloys and compounds, 232(1-2), 1996, pp. 1-4
Citations number
16
Categorie Soggetti
Chemistry Physical","Metallurgy & Metallurigical Engineering","Material Science
ISSN journal
09258388
Volume
232
Issue
1-2
Year of publication
1996
Pages
1 - 4
Database
ISI
SICI code
0925-8388(1996)232:1-2<1:TXOTTN>2.0.ZU;2-9
Abstract
The isothermal section of the Nd-Ag-Si phase diagram at 600 degrees C over the whole concentration region has been constructed using X-ray p hase analysis. Four NdAg2Si2 (CeGa2Al2-type), NdAgSi (AlB2-type), NdAg 0.2-0.25Si1.8-1.25 (alpha-ThSi2-type) and Nd5Ag0.5Si3.5 (Sm5Ge4-type). The crystal structure of the Nd5Ag0.5Si3.5 compound has been determin ed by single-crystal analysis; other structures have been established using X-ray powder diffraction data.