EFFECT OF ZIRCONIA DOPING ON THE ELECTRICAL BEHAVIOR OF YTTRIA

Citation
Cc. Wang et al., EFFECT OF ZIRCONIA DOPING ON THE ELECTRICAL BEHAVIOR OF YTTRIA, Journal of materials research, 11(2), 1996, pp. 422-429
Citations number
30
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
11
Issue
2
Year of publication
1996
Pages
422 - 429
Database
ISI
SICI code
0884-2914(1996)11:2<422:EOZDOT>2.0.ZU;2-P
Abstract
The ac electrical behavior of yttria doped with a zirconia concentrati on ranging from 0.15 to 20 mole % is investigated in the temperature r ange of 800 to 1300 degrees C. The ac electrical data, obtained in the range from 5 Hz to 13 MHz, indicated two distinct relaxations when an alyzed in the impedance plane. These relaxations are attributed to lum ped grains and trapping within grain boundaries, including possible el ectrode/sample effects. The admittance plane analysis revealed a semic ircular relaxation in the low-frequency region, indicating identical r esponse to that of the low-frequency relaxation of the impedance plane . The incorporation of zirconia into yttria is found to lower the acti vation energy of conduction in the grains and enhance ionic contributi on to the overall electrical conduction. The P-O2 studies and transfer ence number measurements near atmospheric region indicate that p-type conduction dominates for the lightly doped yttria. An ionic contributi on to the conduction processes becomes significant in heavily doped sa mples at/near atmospheric P-O2.