RECOMBINATION IN NANOPHASE TIO2 FILMS

Citation
R. Konenkamp et R. Henninger, RECOMBINATION IN NANOPHASE TIO2 FILMS, Applied physics. A, Solids and surfaces, 58(1), 1994, pp. 87-90
Citations number
10
Categorie Soggetti
Physics, Applied
ISSN journal
07217250
Volume
58
Issue
1
Year of publication
1994
Pages
87 - 90
Database
ISI
SICI code
0721-7250(1994)58:1<87:RINTF>2.0.ZU;2-P
Abstract
Recombination and transport parameters were determined in Schottky dio des made of thin TiO2 solgel films with particle size around 50 nm. Ef fective recombination times are typically in the range, 10 mus < tau < 1 ms, depending on injection level. The lifetimes are found to decrea se at higher current levels, indicating bimolecular recombination kine tics due to a progressive increase in trap occupation. The mobility-li fetime product is estimated to be approximately 5 X 10(-11) cm2/V and is independent of current level.