Ra. Allen et al., THE ENHANCED VOLTAGE-DIVIDING POTENTIOMETER FOR HIGH-PRECISION FEATURE PLACEMENT METROLOGY, IEEE transactions on instrumentation and measurement, 45(1), 1996, pp. 136-141
Enhancements to the voltage-dividing potentiometer, an electrical test
structure for measuring the spatial separations of pairs of conductin
g features, are presented and discussed, These enhancements reduce or
eliminate systematic errors which can otherwise lead to uncertainties
as large as several hundred nanometers, These systematic errors, attri
buted by modeling to asymmetries at certain intersections of conductin
g features in the test structure, are eliminated by modifications to t
he test structure and test procedures.