Powder-x-ray-diffraction measurements on siloxene and calculations of
the diffraction patterns for the three commonly proposed structures of
siloxene (Si6H6O3) clearly show that only a structure with silicon la
yers is ever:observed. The formation of siloxene from CaSi2 is topotac
tic, with the Si layers remaining intact and with no oxygen insertion
into these layers. Siloxene prepared at 0 degrees C has very little ox
ygen incorporated into the interlayer gaps, and can be described as hy
drogen terminated silicon layers (Si6H6), which we call layered polysi
lane. Layered polysilane can be purified by reaction with aqueous HF a
nd is pyrophoric on contact with air. In some sense, layered polysilan
e can be considered the silicon equivalent of graphite.