A SINGLE-CRYSTAL X-RAY DIFFRACTOMETER FOR WHITE SYNCHROTRON-RADIATIONWITH SOLID-STATE DETECTORS - ENERGY-DISPERSIVE LAUE (EDL) INSTRUMENT AT HASYLAB, HAMBURG GERMANY

A new instrument for X-ray diffraction offers the use of ''white'' syn chrotron radiation on a small sample producing a Laue pattern and sele cting parts of the spectrum for sending reflections into two energy di spersive detectors. Integrated Bragg intensities of up to 20 ''harmoni cs'' are obtained simultaneously. The sample is mounted on a Kappa gon iometer with a lot of angular space around it for controlling special environments. Possibilities are provided for energy dependent polariza tion monitoring, for fine adjustment of the diffractometer, and for in stalling different monochromators and auxiliary equipment for limiting unwanted fluorescence and other background. The EDL diffractometer is controlled via CAMAC by a PC which also handles collecting as well as reduction of data. A number of applications are mentioned and partly demonstrated by test results.