DETERMINATION OF THE SPECTRAL RESPONSE OF SIS-JUNCTIONS BY A DIRECT-DETECTION MEASUREMENT

Authors
SCHUSTER KF ROTHERMEL H
Citation
Kf. Schuster et H. Rothermel, DETERMINATION OF THE SPECTRAL RESPONSE OF SIS-JUNCTIONS BY A DIRECT-DETECTION MEASUREMENT, International journal of infrared and millimeter waves, 17(2), 1996, pp. 333-344
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied",Optics
Journal title
International journal of infrared and millimeter waves → ACNP
ISSN journal
01959271
Volume
17
Issue
2
Year of publication
1996
Pages
333 - 344
Database
ISI
SICI code
0195-9271(1996)17:2<333:DOTSRO>2.0.ZU;2-F
Abstract
We present a simple method to determine the spectral response of an SI S detector in the millimeter and submillimeter wavelength range from i ts current response to a chopped cold-load. This direct detection resp onse is also a good indicator of quantum efficiency and mixer noise te mperature when using the SIS junction in heterodyne mode. A simple exp erimental setup without local oscillator, cryogenic IF-amplifier or an y quasioptical interferometer allows a quick diagnosis of integrated p lanar impedance matching structures.