USE OF THE AUTODYNE DETECTION EFFECT IN SEMICONDUCTOR MICROWAVE-OSCILLATORS TO BUILD RADIOWAVE INSPECTION DEVICES

Citation
Da. Usanov et al., USE OF THE AUTODYNE DETECTION EFFECT IN SEMICONDUCTOR MICROWAVE-OSCILLATORS TO BUILD RADIOWAVE INSPECTION DEVICES, Russian journal of nondestructive testing, 31(5), 1995, pp. 327-331
Citations number
11
Categorie Soggetti
Materials Science, Characterization & Testing
ISSN journal
10618309
Volume
31
Issue
5
Year of publication
1995
Pages
327 - 331
Database
ISI
SICI code
1061-8309(1995)31:5<327:UOTADE>2.0.ZU;2-G
Abstract
The feasibility of using the autodyne detection effect in diode microw ave oscillators for checking the parameters of materials is substantia ted theoretically on the basis of numerical analysis. The response of a diode microwave autodyne is described on the basis of a discussion o f the equivalent circuit of an oscillator in which the complex conduct ance of the load is determined by the parameters of the material studi ed and the characteristics of the electrodynamic system. Information f rom theoretical and experimental studies is given about building a non destructive testing instrument with an operating principle based on th e autodyne detection effect: thickness gauges for metal-insulator stru ctures and dielectric-constant meters.