Silver nanocrystal doped silica films were prepared by the sol-gel pro
cess. The sol was prepared from 1:0.12:12:0.2:6:7 molar ratios of C2H5
)(4):AgNO3:H2O:HNO3:(C3H7OH)-H-n:(C4H9OH)-H-i. The glassy, highly tran
sparent film with high dopant concentration (silver/silicon atomic rat
io = 0.12) was successfully prepared by the dip-coating method. After
drying in air at 60 degrees C for 30 min, samples were heat-treated, i
n air, at 300, 350, 400, 450, 500 and 550 degrees C using 30-100 min s
oaking periods for each step in a cumulative heating procedure. Measur
ements on the films were made by ultraviolet-visible and infrared spec
troscopy, X-ray photoelectron spectroscopy, Rutherford backscattering
spectrometry and transmission electron microscopy. Mechanisms of silve
r colloid formation in the densified silica matrix with respect to the
thermal treatment are discussed. To understand the formation of silve
r nanocrystals from the silver silicate network, the corresponding dop
ed bulk gel samples were analyzed by X-ray diffraction and differentia
l scanning calorimetry.