RELAXATION AND THERMAL HYSTERESIS IN THE ELECTRICAL-RESISTIVITY OF (ND1.6SR0.4)NIO4+DELTA COMPOUNDS

Citation
Jb. Sousa et al., RELAXATION AND THERMAL HYSTERESIS IN THE ELECTRICAL-RESISTIVITY OF (ND1.6SR0.4)NIO4+DELTA COMPOUNDS, Physica. B, Condensed matter, 192(4), 1993, pp. 358-364
Citations number
11
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
09214526
Volume
192
Issue
4
Year of publication
1993
Pages
358 - 364
Database
ISI
SICI code
0921-4526(1993)192:4<358:RATHIT>2.0.ZU;2-1
Abstract
We have measured the electrical resistivity from 10-300 K of two nomin ally identical samples of (Nd1.6Sr0.4)NiO4+delta. Both samples display clear semiconductor-like behaviour down to approximately 70 K. Below there are a series of transitional effects associated with metallic an d magnetic behaviour. Since both samples are in the critical range whe re the tetragonal structure is being stabilised the behaviour is sampl e dependent. It is shown that both magnetic and structural effects inf luence the thermal hysteresis present in the electrical resistivity be low 70 K.