Jb. Sousa et al., RELAXATION AND THERMAL HYSTERESIS IN THE ELECTRICAL-RESISTIVITY OF (ND1.6SR0.4)NIO4+DELTA COMPOUNDS, Physica. B, Condensed matter, 192(4), 1993, pp. 358-364
We have measured the electrical resistivity from 10-300 K of two nomin
ally identical samples of (Nd1.6Sr0.4)NiO4+delta. Both samples display
clear semiconductor-like behaviour down to approximately 70 K. Below
there are a series of transitional effects associated with metallic an
d magnetic behaviour. Since both samples are in the critical range whe
re the tetragonal structure is being stabilised the behaviour is sampl
e dependent. It is shown that both magnetic and structural effects inf
luence the thermal hysteresis present in the electrical resistivity be
low 70 K.