CRITICAL CURRENTS AND SUPERCURRENT OSCILLATIONS IN JOSEPHSON FIELD-EFFECT TRANSISTORS

Citation
A. Chrestin et al., CRITICAL CURRENTS AND SUPERCURRENT OSCILLATIONS IN JOSEPHSON FIELD-EFFECT TRANSISTORS, Physical review. B, Condensed matter, 49(1), 1994, pp. 498-504
Citations number
22
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
49
Issue
1
Year of publication
1994
Pages
498 - 504
Database
ISI
SICI code
0163-1829(1994)49:1<498:CCASOI>2.0.ZU;2-O
Abstract
The dc Josephson effect of a superconductor/two-dimensional electron g as/superconductor (S/2DEG/S) junction in the clean limit is investigat ed with emphasis on the field-effect dependence of the critical curren t. Calculation of the Josephson current is based on solving the Bogoli ubov-de Gennes equations for a steplike variation of the pair potentia l. In the normal conducting region, the motion of electrons is quantiz ed in one direction by means of a triangular-well potential. The 2DEG is contained in a semiconductor treated within the effective-mass appr oximation. We assume an abrupt band-edge jump at the interfaces, and a dditional scattering is taken into account by delta-function potential barriers. Normal scattering leads to the formation of resonant states , which are visible in critical current oscillations. The ratio of Fer mi velocities in the 2DEG and the S regions determines the rates of An dreev and normal scattering and has a large influence on the field-eff ect dependence of the critical current. We take an effective mass suit able for the inversion layer on p-type InAs and consider Nb for the su perconducting contacts. Typical magnitudes of the calculated critical current are some muA-per-mum junction width for experimentally accessi ble values of junction length, temperature, and surface carrier densit y of the 2DEG.