A. Chrestin et al., CRITICAL CURRENTS AND SUPERCURRENT OSCILLATIONS IN JOSEPHSON FIELD-EFFECT TRANSISTORS, Physical review. B, Condensed matter, 49(1), 1994, pp. 498-504
The dc Josephson effect of a superconductor/two-dimensional electron g
as/superconductor (S/2DEG/S) junction in the clean limit is investigat
ed with emphasis on the field-effect dependence of the critical curren
t. Calculation of the Josephson current is based on solving the Bogoli
ubov-de Gennes equations for a steplike variation of the pair potentia
l. In the normal conducting region, the motion of electrons is quantiz
ed in one direction by means of a triangular-well potential. The 2DEG
is contained in a semiconductor treated within the effective-mass appr
oximation. We assume an abrupt band-edge jump at the interfaces, and a
dditional scattering is taken into account by delta-function potential
barriers. Normal scattering leads to the formation of resonant states
, which are visible in critical current oscillations. The ratio of Fer
mi velocities in the 2DEG and the S regions determines the rates of An
dreev and normal scattering and has a large influence on the field-eff
ect dependence of the critical current. We take an effective mass suit
able for the inversion layer on p-type InAs and consider Nb for the su
perconducting contacts. Typical magnitudes of the calculated critical
current are some muA-per-mum junction width for experimentally accessi
ble values of junction length, temperature, and surface carrier densit
y of the 2DEG.