NONUNIVERSAL CRITICAL EXPONENTS FOR THE SUPERCONDUCTING CRITICAL-CURRENT IN LEAD THIN-FILMS

Citation
Mc. Hernandez et al., NONUNIVERSAL CRITICAL EXPONENTS FOR THE SUPERCONDUCTING CRITICAL-CURRENT IN LEAD THIN-FILMS, Physical review. B, Condensed matter, 49(1), 1994, pp. 674-677
Citations number
10
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
49
Issue
1
Year of publication
1994
Pages
674 - 677
Database
ISI
SICI code
0163-1829(1994)49:1<674:NCEFTS>2.0.ZU;2-L
Abstract
We present experimental results on electrical measurements of evaporat ed thin lead films (inverse swiss cheese model) and ion-milled thin fi lms (swiss cheese model) at liquid-helium temperatures near the superc onductor-insulator percolation threshold. We provide evidence for the nonuniversality of the critical exponents for the critical current in two dimensions for the two systems studied, in good agreement with the oretical results.