Mj. Cunningham et al., ACTIVE VIBRATION CONTROL AND ACTUATION OF A SMALL CANTILEVER FOR APPLICATIONS IN SCANNING PROBE INSTRUMENTS, Sensors and actuators. A, Physical, 50(1-2), 1995, pp. 147-150
The deflection control of a small cantilever is described, which opera
tes using a single active piezoelectric element and optical vibration
sensing, so that unwanted vibrations in the cantilever are removed, an
d yet it remains possible to deflect the cantilever statically or dyna
mically as required. Such a control system is directly applicable to t
he very small cantilevers found in scanning probe microscopes, such as
atomic force and magnetic force microscopes, the resolution of which
is limited by unwanted vibration.