GRAZING-INCIDENCE X-RAY-DIFFRACTION STUDIES OF THIN-FILMS USING AN IMAGING PLATE DETECTION SYSTEM

Citation
Gj. Foran et al., GRAZING-INCIDENCE X-RAY-DIFFRACTION STUDIES OF THIN-FILMS USING AN IMAGING PLATE DETECTION SYSTEM, Langmuir, 12(3), 1996, pp. 774-777
Citations number
11
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
07437463
Volume
12
Issue
3
Year of publication
1996
Pages
774 - 777
Database
ISI
SICI code
0743-7463(1996)12:3<774:GXSOTU>2.0.ZU;2-0
Abstract
First results of the grazing incidence X-ray diffraction patterns of c admium arachidate Langmuir-Blodgett (LB) films measured using imaging plate detection are presented and discussed. The use of imaging plates has made possible the observation of diffraction peaks at far higher values of wavevector transfer than have been observed previously with other methods of detection, with a dramatic increase in signal-to-nois e ratio. Values of in-plane d-spacing, area per molecule, and position al correlation length of the hexatic-B phase of a monolayer of cadmium arachidate are in excellent agreement with previous measurements. Mul tilayer LB films showed, in addition to the in-plane spots Q(110) and Q(200), sets of off-plane diffraction spots (Q(hkl), l > 0) which are observed up to a Q(2) value of 3.3 Angstrom(-1). Spots with both odd a nd even values of l are observed.