THE CRYSTALLIZATION OF THIN NI-ZR ALLOYS OBSERVED IN THE DIFFRACTION MODE OF AN ELECTRON-MICROSCOPE

We present the results of crystallization of amorphous thin Ni-Zr allo y films. The alloys were prepared by the sputter-deposition technique over the continuous composition range Ni92.7Zr7.3 to Ni20.7Zr79.3. The samples were heated in the electron microscope incorporating the micr oscope heating stage and crystallization was viewed through the diffra ction mode. The average grain sizes of the microstructure after coolin g to room temperature were measured. It was found that there was no en hancement of the crystallization temperature, T(x), in the region of t he eutectics and that the compositional dependence of crystallization temperature bore no relation to features of the equilibrium phase diag ram. Comparison of T(x) of thin alloys with that of sputtered 5 mum th ick alloys heated in the differential scanning calorimeter yielded inc onclusive results from the temperature-thickness relationship. Results of T(x) from some melt-quench alloys are also compared with our data.