PARTICLE-INDUCED X-RAY-EMISSION (PIXE) AND RADIOCHEMISTRY STUDY OF POLY(PYRROLE) DOPED WITH TOLUENESULFONATE OR POLYSTYRENESULFONATE ANIONS

Citation
O. Stephan et al., PARTICLE-INDUCED X-RAY-EMISSION (PIXE) AND RADIOCHEMISTRY STUDY OF POLY(PYRROLE) DOPED WITH TOLUENESULFONATE OR POLYSTYRENESULFONATE ANIONS, Synthetic metals, 75(3), 1995, pp. 181-185
Citations number
18
Categorie Soggetti
Physics, Condensed Matter","Metallurgy & Metallurigical Engineering
Journal title
ISSN journal
03796779
Volume
75
Issue
3
Year of publication
1995
Pages
181 - 185
Database
ISI
SICI code
0379-6779(1995)75:3<181:PX(ARS>2.0.ZU;2-3
Abstract
Poly(pyrrole) films have been prepared at constant current using two d ifferent doping ions (i.e., toluenesulfonate ions or polystyrenesulfon ate ions). Particle induced X-ray emission experiments show that incor poration is reversible with toluenesulfonate anions: when the films ar e reduced in 0.1 mol dm(-3) KNO3 solutions, all the anions incorporate d during the synthesis are released. With polystyrenesulfonate ions, h owever, the incorporation is irreversible. It is likely that such film s have cation exchanging properties. This phenomenon has been studied using barium ions, the incorporation of which was monitored using a ra diochemical method.