SIMULTANEOUS X-RAY-DIFFRACTION AND DIFFERENTIAL THERMAL-ANALYSIS OF POLYMERS

Simultaneous measurement of X-ray diffraction patterns and differentia l temperature curves is an excellent method to eliminate the disadvant ages in common DSC analysis. Problems in DSC analysis of polymers incl ude phenomena such as multiple melting and fractionated crystallizatio n. By simultaneous registration of X-ray diffraction patterns the melt ing and crystallization peaks can be assigned to different phases in m ultiphase materials. A sample holder was developed which serves the re quirements for simultaneous measurement of X-ray diagrams and differen tial temperature curves. The necessity for the development of the syst em is shown as well as details of the sample holder and test measureme nts on polyamides.