Kw. Kobayashi et al., A MONOLITHIC DC TEMPERATURE COMPENSATION BIAS SCHEME FOR MULTISTAGE HEMT INTEGRATED-CIRCUITS, IEEE transactions on microwave theory and techniques, 44(2), 1996, pp. 261-268
This work benchmarks the first demonstration of a multistage monolithi
c HEMT IC design which incorporates a de temperature compensated curre
nt-mirror bias scheme, This is believed to be the first demonstrated m
onolithic HEMT bias scheme of its kind, The active bias approach has b
een applied to a 2-18 GHz five-section low noise HEMT distributed ampl
ifier which achieves a nominal gain of 12.5 dB and a noise figure <2.5
dB across a 2-18 GHz band, The regulated current-mirror scheme achiev
es better than 0.2% current regulation over a 0-125 degrees C temperat
ure range, The RF gain response was also measured over the same temper
ature range and showed less than 0.75 dB gain degradation, This result
s in a -0.006 dB/degrees C temperature coefficient which is strictly d
ue to HEMT device G(m) variation with temperature. The regulated curre
nt-mirror circuit can be employed as a stand-alone V-gs-voltage refere
nce circuit which can be monolithically applied to the gate bias termi
nal of existing HEMT IC's for providing temperature compensated perfor
mance, This monolithic bias approach provides a practical solution to
de bias regulation and temperature compensation for HEMT MMIC's which
can improve the performance, reliability, and cost of integrated micro
wave assemblies (IMA's) used in space-flight military applications.