A MONOLITHIC DC TEMPERATURE COMPENSATION BIAS SCHEME FOR MULTISTAGE HEMT INTEGRATED-CIRCUITS

Citation
Kw. Kobayashi et al., A MONOLITHIC DC TEMPERATURE COMPENSATION BIAS SCHEME FOR MULTISTAGE HEMT INTEGRATED-CIRCUITS, IEEE transactions on microwave theory and techniques, 44(2), 1996, pp. 261-268
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00189480
Volume
44
Issue
2
Year of publication
1996
Pages
261 - 268
Database
ISI
SICI code
0018-9480(1996)44:2<261:AMDTCB>2.0.ZU;2-3
Abstract
This work benchmarks the first demonstration of a multistage monolithi c HEMT IC design which incorporates a de temperature compensated curre nt-mirror bias scheme, This is believed to be the first demonstrated m onolithic HEMT bias scheme of its kind, The active bias approach has b een applied to a 2-18 GHz five-section low noise HEMT distributed ampl ifier which achieves a nominal gain of 12.5 dB and a noise figure <2.5 dB across a 2-18 GHz band, The regulated current-mirror scheme achiev es better than 0.2% current regulation over a 0-125 degrees C temperat ure range, The RF gain response was also measured over the same temper ature range and showed less than 0.75 dB gain degradation, This result s in a -0.006 dB/degrees C temperature coefficient which is strictly d ue to HEMT device G(m) variation with temperature. The regulated curre nt-mirror circuit can be employed as a stand-alone V-gs-voltage refere nce circuit which can be monolithically applied to the gate bias termi nal of existing HEMT IC's for providing temperature compensated perfor mance, This monolithic bias approach provides a practical solution to de bias regulation and temperature compensation for HEMT MMIC's which can improve the performance, reliability, and cost of integrated micro wave assemblies (IMA's) used in space-flight military applications.