Zh. Gu et al., OBSERVATION OF GIANT ENHANCED BACKSCATTERING OF LIGHT FROM WEAKLY ROUGH DIELECTRIC FILMS ON REFLECTING METAL SUBSTRATES, Optical engineering, 35(2), 1996, pp. 370-375
The enhanced backscattering of light from a randomly rough surface, wh
ich is manifested as a narrow peak in the retroreflection direction in
the angular distribution of the intensity of the light that is scatte
red diffusely, has been extensively studied. Both theoretical and expe
rimental investigations have shown that the height of the peak is neve
r more than twice the height of the background at the position of the
peak. We report the observation of a giant enhanced backscattering of
light from a randomly weak rough dielectric film on a reflecting metal
substrate, in which the ratio of the height of the peak to the height
of the background at its position is greater than 10. It is found tha
t this giant enhanced backscattering peak is accompanied by concentric
circular interference fringes, whose axis is normal to the mean scatt
ering surface, with both the specular and backscattering peak on the s
ame ring. A possible mechanism for the giant backscattering is suggest
ed. (C) 1996 Society of Photo-Optical Instrumentation Engineers.