DIFFRACTION AT 8-KEV X-RAYS OF BRAGG-FRESNEL OPTICS

Authors
YUAN LX FAN ZX WANG RW
Citation
Lx. Yuan et al., DIFFRACTION AT 8-KEV X-RAYS OF BRAGG-FRESNEL OPTICS, Optical engineering, 35(2), 1996, pp. 467-469
Citations number
9
Categorie Soggetti
Optics
Journal title
Optical engineering → ACNP
ISSN journal
00913286
Volume
35
Issue
2
Year of publication
1996
Pages
467 - 469
Database
ISI
SICI code
0091-3286(1996)35:2<467:DA8XOB>2.0.ZU;2-1
Abstract
The basic elements of Bragg-Fresnel multilayer optics are multilayer g ratings. In this paper, the fabrication process for the simplest Bragg -Fresnel multilayer optics is given; the diffraction measurements at 8 -keV x rays of multilayer gratings are presented; and the measurement results in the diffraction spectrum are analyzed and discussed in deta il. (C) 1996 Society of Photo-Optical Instrumentation Engineers.