SUBSURFACE IMAGING BY SCANNING THERMAL MICROSCOPY

Citation
A. Hammiche et al., SUBSURFACE IMAGING BY SCANNING THERMAL MICROSCOPY, Measurement science & technology, 7(2), 1996, pp. 142-150
Citations number
15
Categorie Soggetti
Instument & Instrumentation",Engineering
ISSN journal
09570233
Volume
7
Issue
2
Year of publication
1996
Pages
142 - 150
Database
ISI
SICI code
0957-0233(1996)7:2<142:SIBSTM>2.0.ZU;2-A
Abstract
Scanning probe thermal microscopy has been used to achieve sub-surface imaging of metallic particles embedded in a polymer matrix, using a p robe which can act as both ohmic heater and thermometer. A lateral res olution of the order of a micron and a depth detection of a few micron s were achieved. Together with the description of the technique and th e experimental results obtained, a basic theoretical framework is pres ented which describes heat flow and temperature distributions within a sample consisting of inclusions buried within a bulk material. Comput er models have been developed to give theoretical heat flows and tempe rature profiles: these are compared here with the experimental data. T he theoretical lateral resolution was found to be in good agreement wi th the experimental observation. We show that theoretical modelling ca n be used to calibrate the instrument for specific investigations. For example, the technique could be used quantitatively to determine and map thermal conductivity variations across heterogeneous samples, or t o determine the depth at which inclusions are located in the case wher e the thermal conductivities of both the inclusions and the enclosing material are known as well as the geometry of the inclusions.