M. Amman et al., ATOMIC-FORCE MICROSCOPY STUDY OF ELECTRON-BEAM WRITTEN CONTAMINATION STRUCTURES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 54-62
Electron radiation induced hydrocarbon contamination can be either a p
roblem or a useful tool in electron beam analyses and lithographies. W
e have used atomic force microscopy to study electron beam written con
tamination structures. Contamination is shown not only to arise from t
he primary electron beam but also from the energy scattered outside of
the direct impingement area. The size of the contamination structures
correlates well with that expected from electron scattering theory. B
y varying the geometry of the written structures, the rate at which th
e electron dose is deposited, and the nearby hydrocarbon surface densi
ty, we show that surface diffusion of hydrocarbon molecules plays a pr
imary role in the formation of the contamination structures. (C) 1996
American Vacuum Society.