ATOMIC-FORCE MICROSCOPY STUDY OF ELECTRON-BEAM WRITTEN CONTAMINATION STRUCTURES

Citation
M. Amman et al., ATOMIC-FORCE MICROSCOPY STUDY OF ELECTRON-BEAM WRITTEN CONTAMINATION STRUCTURES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 54-62
Citations number
18
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
14
Issue
1
Year of publication
1996
Pages
54 - 62
Database
ISI
SICI code
1071-1023(1996)14:1<54:AMSOEW>2.0.ZU;2-U
Abstract
Electron radiation induced hydrocarbon contamination can be either a p roblem or a useful tool in electron beam analyses and lithographies. W e have used atomic force microscopy to study electron beam written con tamination structures. Contamination is shown not only to arise from t he primary electron beam but also from the energy scattered outside of the direct impingement area. The size of the contamination structures correlates well with that expected from electron scattering theory. B y varying the geometry of the written structures, the rate at which th e electron dose is deposited, and the nearby hydrocarbon surface densi ty, we show that surface diffusion of hydrocarbon molecules plays a pr imary role in the formation of the contamination structures. (C) 1996 American Vacuum Society.