HIGH-RESOLUTION X-RAY PHOTOELECTRON-SPECTROSCOPY OF CRYSTALLINE AND AMORPHOUS POLY(ETHYLENE-TEREPHTHALATE) - A STUDY OF BIAXIALLY ORIENTED FILM, SPIN CAST FILM AND POLYMER MELT

Citation
G. Beamson et al., HIGH-RESOLUTION X-RAY PHOTOELECTRON-SPECTROSCOPY OF CRYSTALLINE AND AMORPHOUS POLY(ETHYLENE-TEREPHTHALATE) - A STUDY OF BIAXIALLY ORIENTED FILM, SPIN CAST FILM AND POLYMER MELT, Polymer, 37(3), 1996, pp. 379-385
Citations number
26
Categorie Soggetti
Polymer Sciences
Journal title
ISSN journal
00323861
Volume
37
Issue
3
Year of publication
1996
Pages
379 - 385
Database
ISI
SICI code
0032-3861(1996)37:3<379:HXPOCA>2.0.ZU;2-S
Abstract
High-resolution monochromated X-ray photoelectron spectroscopy (X.p.s. ) (core line and valence band) was used to study polylethylene terepht halate (PET) as biaxially oriented crystalline film, spin cast amorpho us film and amorphous polymer melt. On going from crystalline to amorp hous PET the C 1s glycol component shifts similar to +0.10 to +0.14 eV , relative to the aromatic and carboxyl components. We ascribe this to the change from trans- to gauche-conformation of the glycol segment. Small differences occur in the valence bands of the crystalline and am orphous samples. Time-dependent studies demonstrate that the melt spec tra are not significantly affected by thermal degradation. Under the c onditions of the X.p.s. analysis molten PET behaves as an electrical c onductor.