HIGH-RESOLUTION X-RAY PHOTOELECTRON-SPECTROSCOPY OF CRYSTALLINE AND AMORPHOUS POLY(ETHYLENE-TEREPHTHALATE) - A STUDY OF BIAXIALLY ORIENTED FILM, SPIN CAST FILM AND POLYMER MELT
G. Beamson et al., HIGH-RESOLUTION X-RAY PHOTOELECTRON-SPECTROSCOPY OF CRYSTALLINE AND AMORPHOUS POLY(ETHYLENE-TEREPHTHALATE) - A STUDY OF BIAXIALLY ORIENTED FILM, SPIN CAST FILM AND POLYMER MELT, Polymer, 37(3), 1996, pp. 379-385
High-resolution monochromated X-ray photoelectron spectroscopy (X.p.s.
) (core line and valence band) was used to study polylethylene terepht
halate (PET) as biaxially oriented crystalline film, spin cast amorpho
us film and amorphous polymer melt. On going from crystalline to amorp
hous PET the C 1s glycol component shifts similar to +0.10 to +0.14 eV
, relative to the aromatic and carboxyl components. We ascribe this to
the change from trans- to gauche-conformation of the glycol segment.
Small differences occur in the valence bands of the crystalline and am
orphous samples. Time-dependent studies demonstrate that the melt spec
tra are not significantly affected by thermal degradation. Under the c
onditions of the X.p.s. analysis molten PET behaves as an electrical c
onductor.