We propose an objective pattern recognition procedure to determine bra
nching angles in a-dimensional fractals. Recognition is performed by c
orrelating the object with V-shaped identifiers. We define a quantitat
ive criterion to prove the existence of characteristic branching angle
s in such figures. The whole procedure is tested on a mathematical (sn
owflake) fractal and then applied to a few physical examples. A neat c
haracteristic angle is found in dendritic aggregates, in agreement wit
h visual impression. However, the procedure does not find any dominant
branching angle in basic Witten and Sander aggregates.