A COMPACT FLAT-CRYSTAL X-RAY SPECTROMETER FOR EXTERNAL-BEAM PIXE MEASUREMENTS

Authors
TESAURO P MANDO PA PARRINI G PECCHIOLI A SONA P
Citation
P. Tesauro et al., A COMPACT FLAT-CRYSTAL X-RAY SPECTROMETER FOR EXTERNAL-BEAM PIXE MEASUREMENTS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 108(1-2), 1996, pp. 197-204
Citations number
23
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
108
Issue
1-2
Year of publication
1996
Pages
197 - 204
Database
ISI
SICI code
0168-583X(1996)108:1-2<197:ACFXSF>2.0.ZU;2-V
Abstract
A wavelength dispersive system based on a flat crystal coupled to a CC D position-sensitive detector is described. The system, to be used in conjunction with an external beam facility for PIXE measurements, is p articularly compact, easy to use, and has a useful energy range extend ing from about 4 to 13 keV. The performance of the system with respect to efficiency and energy resolution is studied as a function of diffe rent experimental conditions. Possible simple applications are briefly discussed.