SCALING OF SURFACE-ROUGHNESS IN EVAPORATED CALCIUM-FLUORIDE FILMS

Authors
MBISE GW NIKLASSON GA GRANQVIST CG
Citation
Gw. Mbise et al., SCALING OF SURFACE-ROUGHNESS IN EVAPORATED CALCIUM-FLUORIDE FILMS, Solid state communications, 97(11), 1996, pp. 965-969
Citations number
40
Categorie Soggetti
Physics, Condensed Matter
Journal title
Solid state communications → ACNP
ISSN journal
00381098
Volume
97
Issue
11
Year of publication
1996
Pages
965 - 969
Database
ISI
SICI code
0038-1098(1996)97:11<965:SOSIEC>2.0.ZU;2-4
Abstract
The surface roughness of evaporated CaF2 films was studied by Atomic F orce Microscopy. Scaling exponents for kinetic roughening, alpha and b eta, were found to be close to 1 and 1/2, respectively. These values w ere interpreted in terms of unstable growth of columnar structures due to Schwoebel barriers for diffusing atoms at steps in the surface.