We report a technique for investigating nucleation and growth confined
to nanometer scale surfaces. Lithographic and etching processes were
used to create arrays of 100 and 150 nm holes through a thin SiO2 laye
r onto Si(100). Ge dots were nucleated and grown to a few nanometers i
n diameter within the patterned wells. Transmission electron and atomi
c force microscopic analyses revealed the presence of 0-1 Ge quantum d
ots in each of the 100 nm wells and 2-4 dots in the 150 Mn wells. For
the latter case, size-distance correlations indicated the effective ra
dius of the diffusion field around a growing Ge particle was much larg
er than for growth on an infinite surface.