L. Beck et al., X-RAY-DETECTOR CALIBRATION AT CEA BRUYERES-LE-CHATEL/, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 369(2-3), 1996, pp. 401-406
At CEA/Bruyeres-le-Chatel (Service GEM), then are facilities to calibr
ate X-ray detectors from 200 eV to 100 keV, with an accuracy of 4% at
high energies (E > 3 keV). The source is the direct radiation from the
X-ray tubes [C-K alpha (277 eV) to Ti-K alpha K beta (4.51/4.93 keV)]
or fluorescence emission from secondary targets [ME(K alpha) (1.25 ke
V) to U-K alpha (98 keV)]. In addition, calibrations are carried out w
ith the synchrotron radiation of the Super-AGO storage ring (LURE-Orsa
y), by selecting the monoenergetic beams with a double crystal monochr
omator which is tunable between 0.8 and 8 keV. The resolution is bette
r than 1 eV. This last tool is very useful in the study of the absorpt
ion edges of the detector compounds (for example, Si K-edge and Ar K-e
dge). Some examples are presented of results obtained between 1 and 50
keV, with special reference to high flux detectors such as gold photo
cathodes and silicon avalanche photodiodes. Thick silicon photodiodes
(for the high energy range) were also calibrated.