SPARK-GAP ATOMIC-EMISSION MICROSCOPY

A new technique allowing elemental analysis of small regions of scanni ng tunneling microscopy (STM) substrates without loss of tip-surface r egistry has been developed. The technique is based on spark atomic emi ssion spectroscopy and provides information normally unavailable from the STM. In this technique, a voltage excursion (> 100 V) is used to e xcite the sample and cause emission. Spectra from a polished copper el ectrode surface are presented and discussed. Important parameters and present limitations are also discussed along with future directions fo r the improvement and long-term use of the technique.