The silylation of borosilicate with APTS ((gamma-aminopropyl)triethoxy
silane) is studied as a tool to improve zeolite incorporation in PI (p
olyimide) films. Among other experimental parameters, a quantification
of the zeolite outer surface silanols is performed in order to determ
ine the most appropriate silylation conditions. Xylene sorptions, NMR
(nuclear magnetic resonance) spectroscopy, and measurements of the spe
cific surface of the zeolites were performed to characterize the silyl
ation. Finally, the silylated zeolite was incorporated in PI films on
which tensile strength, density, and xylene sorption were measured.