GROWTH AND DOPING OF GAASSB VIA METALORGANIC CHEMICAL-VAPOR-DEPOSITION FOR INP HETEROJUNCTION BIPOLAR-TRANSISTORS

Citation
Bt. Mcdermott et al., GROWTH AND DOPING OF GAASSB VIA METALORGANIC CHEMICAL-VAPOR-DEPOSITION FOR INP HETEROJUNCTION BIPOLAR-TRANSISTORS, Applied physics letters, 68(10), 1996, pp. 1386-1388
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
68
Issue
10
Year of publication
1996
Pages
1386 - 1388
Database
ISI
SICI code
0003-6951(1996)68:10<1386:GADOGV>2.0.ZU;2-N
Abstract
GaAsSb is a low band gap, lattice matched to InP, alternative to GaInA s. Growth and doping using diethyltellurium and carbon tetrachloride w ere investigated. Hole concentrations up to 1.3X10(20) cm(-3) have bee n achieved in as-grown carbon-doped GaAsSb [i.e., no postgrowth anneal ing was necessary for dopant activation, a key requirement for n-p-n h eterojunction bipolar transistor (HBT) structures]. This is a sevenfol d improvement over the best carbon-doped InGaAs reported by metalorgan ic chemical vapor deposition. Hall measurements indicate that GaAsSb's hole mobility is 55%-60% of GaInAs's, for a given carrier concentrati on. InP HBTs with carbon-doped GaAsSb base are demonstrated. (C) 1996 American Institute of Physics.