Bt. Mcdermott et al., GROWTH AND DOPING OF GAASSB VIA METALORGANIC CHEMICAL-VAPOR-DEPOSITION FOR INP HETEROJUNCTION BIPOLAR-TRANSISTORS, Applied physics letters, 68(10), 1996, pp. 1386-1388
GaAsSb is a low band gap, lattice matched to InP, alternative to GaInA
s. Growth and doping using diethyltellurium and carbon tetrachloride w
ere investigated. Hole concentrations up to 1.3X10(20) cm(-3) have bee
n achieved in as-grown carbon-doped GaAsSb [i.e., no postgrowth anneal
ing was necessary for dopant activation, a key requirement for n-p-n h
eterojunction bipolar transistor (HBT) structures]. This is a sevenfol
d improvement over the best carbon-doped InGaAs reported by metalorgan
ic chemical vapor deposition. Hall measurements indicate that GaAsSb's
hole mobility is 55%-60% of GaInAs's, for a given carrier concentrati
on. InP HBTs with carbon-doped GaAsSb base are demonstrated. (C) 1996
American Institute of Physics.