TRAPPING AND RECOMBINATION VIA DANGLING BONDS IN AMORPHOUS AND GLASSYSEMICONDUCTORS UNDER STEADY-STATE CONDITIONS - APPLICATION TO THE MODULATED PHOTOCURRENT EXPERIMENT
C. Longeaud et Jp. Kleider, TRAPPING AND RECOMBINATION VIA DANGLING BONDS IN AMORPHOUS AND GLASSYSEMICONDUCTORS UNDER STEADY-STATE CONDITIONS - APPLICATION TO THE MODULATED PHOTOCURRENT EXPERIMENT, Physical review. B, Condensed matter, 48(12), 1993, pp. 8715-8741
Interesting features of the modulated photocurrent experiment have bee
n emphasized in a recent paper where we have shown that, if the locali
zed states in the gap belong to the same species of monovalent centers
, then it is possible to deduce both an order of magnitude of the capt
ure cross section and the absolute value of the density of these state
s by means of this experiment. In the present paper, we extend the cal
culation of the dc and ac photocurrent to the case where distributions
of correlated states associated with the well-known dangling bonds (D
B) are present in the material. This calculation includes the contribu
tions of both holes and electrons and takes into account the interacti
ons of both types of carriers with distributions of monovalent as well
as correlated states in the gap of a semiconductor. We concentrate in
particular on the signature of the DB states in the data analysis, th
e correlation energy being either positive or negative. We first deriv
e the variations with respect to energy of the occupation functions of
any distribution of DB states for both signs of the correlation energ
y under steady-state conditions. We show that the concept of quasi-Fer
mi-levels for trapped carriers introduced by Simmons and Taylor for mo
novalent states has to be reconsidered for the correlated states and w
e underline the differences between the cases of positive and negative
correlation energies. We give a clear and comprehensive scheme of the
different recombination paths for the correlated states and derive th
e correct expressions of the electron and hole lifetimes related to th
ese kinds of states. The results of the steady-state-regime study are
then used in a second part to identify how the DB states modify the mo
dulated photocurrent. Simplified expressions of the modulus of the mod
ulated photocurrent and of its phase shift with reference to the ac ex
citation light are given in two cases: a recombination-limited regime
and a trapping- and release-limited regime. The behaviors of the modul
ated photocurrent related to the presence of DB states are also underl
ined in both regimes by means of a numerical simulation. It is shown t
hat a distribution of DB centers exhibiting a positive correlation ene
rgy roughly behaves as two distributions of monovalent states whereas
a distribution of DB centers with a negative correlation energy roughl
y behaves as a single distribution of monovalent states. An important
property of the DB states with a positive correlation energy is that t
hey can give a significant response in the trapping- and release-limit
ed regime even if their ground-energy level is below the Fermi level.
It is also shown that if there are both monovalent- and correlated-sta
te distributions in the gap, it is possible to derive an order of magn
itude of the lowest capture cross sections from the transition between
the recombination-limited and trapping- and release-limited regimes.