S. Yamashina et M. Shigeno, APPLICATION OF ATOMIC-FORCE MICROSCOPY TO ULTRASTRUCTURAL AND HISTOCHEMICAL-STUDIES OF FIXED AND EMBEDDED CELLS, Journal of Electron Microscopy, 44(6), 1995, pp. 462-466
Various methods of sample preparation were used to study the cellular
ultrastructure with an atomic force microscope (AFM), A rather satisfa
ctory fine structure of cellular cross section, that was comparable to
low to medium magnification electron micrographs, was obtained when u
ltrathin sections of epoxy embedded materials cut with a diamond knife
were examined by use of a non-contact mode. No surface treatment was
necessary to image the surface contour of ultrathin sections, Accordin
g to this method, cellular membranes appeared as an elevation in contr
ast to depression of the intercellular space and cytoplasm, The chroma
tin and nucleolus showed an elevated image against the depression of n
ucleoplasm, resulting in the formation of images comparable to those o
btained by conventional transmission electron microscopy, In the secti
on treated for; post-embedding immunohistochemical reaction, colloidal
gold particles larger than 10-15 nm in diameter could be detected as
elevations, By means of Kelvin force probe microscopy (KFM), enhanceme
nt of the surface potential was detected at exactly the same location
as topographically detected gold particles, Application of KFM is expe
cted to become a valuable tool for novel histochemistry with the use o
f AFM.