ELECTRON CORRELATION, METALLIZATION, AND FERMI-LEVEL PINNING AT ULTRATHIN K SI(111) INTERFACES/

Citation
Hh. Weitering et al., ELECTRON CORRELATION, METALLIZATION, AND FERMI-LEVEL PINNING AT ULTRATHIN K SI(111) INTERFACES/, Physical review. B, Condensed matter, 48(11), 1993, pp. 8119-8135
Citations number
91
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
48
Issue
11
Year of publication
1993
Pages
8119 - 8135
Database
ISI
SICI code
0163-1829(1993)48:11<8119:ECMAFP>2.0.ZU;2-G
Abstract
In this paper we present a detailed photoemission study of the K/Si(11 1)7X7 and K/Si(111)(square-root 3 X square-root 3)R 30-degrees-B inter faces. Angle-resolved valence-band spectroscopy reveals the presence o f an almost dispersionless interface state below E(F). Both interfaces are clearly nonmetallic at room-temperature saturation coverage. We c ritically address the issues of charge transfer and Fermi-level pinnin g by a detailed analysis of the K 3p and Si 2p core-level spectra. We conclude that, up to saturation coverage, correlation effects determin e the electronic properties of these interfaces. Metallization occurs during the development of the second layer at cryogenic temperatures.