A DOPPLER BROADENING POSITRON-ANNIHILATION TECHNIQUE FOR THE STUDY OFDEFECTS IN BULK SAMPLES

Citation
Ra. Dunlap et al., A DOPPLER BROADENING POSITRON-ANNIHILATION TECHNIQUE FOR THE STUDY OFDEFECTS IN BULK SAMPLES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 108(3), 1996, pp. 339-342
Citations number
16
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
108
Issue
3
Year of publication
1996
Pages
339 - 342
Database
ISI
SICI code
0168-583X(1996)108:3<339:ADBPTF>2.0.ZU;2-T
Abstract
A Doppler broadening positron annihilation technique which allows for the study of near surface defects in bulk samples is described. The me thod is capable of observing changes in the homogeneous bulk defect co ncentration in a sample acid is also able to characterize spatially lo calized near-surface defects in bulk materials with a resolution of ab out 1 mm. The applicability of this method is demonstrated by measurem ents on a sample of polycrystalline aluminum into which defects have b een introduced by mechanical deformation. Isochronal annealing studies have been used to characterize the defect recovery in this material a nd are compared with results of conventional Doppler broadening measur ements.