R. Venugopal et al., STRUCTURAL AND OPTICAL STUDIES ON VACUUM-EVAPORATED ZNSEXCDS1-X ALLOY-FILMS, Journal of alloys and compounds, 234(1), 1996, pp. 48-51
(ZnSe)(x)(CdS)(1-x) films (about 6 mu m thick) in the entire range of
x have been formed on glass substrates kept at 470 K by thermal evapor
ation. All the films exhibited n-type conductivity. X-ray diffraction
(XRD) studies showed that films with 0 less than or equal to x less th
an or equal to 0.70 were polycrystalline with the wurtzite phase, wher
eas films with 0.8 less than or equal to x less than or equal to 1.0 c
rystallized in the zincblende phase. The lattice parameter varied line
arly with x following Vegard's law in both the structures. The direct
optical band gaps varied non-linearly, showing a downward bowing with
increasing x. The bowing parameter was found to be about 0.39 eV. The
structural transformation region of x obtained by analysing band gap d
ata was found to agree well with that obtained from XRD studies.