A. Rodes et al., ON THE VOLTAMMETRIC AND SPECTROSCOPIC CHARACTERIZATION OF NITRIC-OXIDE ADLAYERS FORMED FROM NITROUS-ACID ON PT(H,K,1) AND RH(H,K,1) ELECTRODES, Electrochimica acta, 41(5), 1996, pp. 729-745
Cyclic voltammetry and in situ FTIR spectroscopy have been employed to
characterize NO adlayers at platinum and rhodium single-crystal elect
rodes. These adlayers, which are generated upon surface decomposition
of nitrous acid, give infrared spectra similar to those observed for t
he same surface at high NO coverages under UHV conditions. The N-O str
etching frequency turned out to be potential dependent with a signific
ant upward shift as the electrode potential increased. The analysis of
the absolute spectra obtained for NO-covered Pt(lll) and Rh(lll) elec
trodes shows a linear variation of the band center frequency of linear
ly bonded NO with slopes of 65 and 20 cm(-1) V-1, respectively. In add
ition to this potential dependence of the N-O stretching frequency, th
e spectra obtained with the Rh(lll) electrode suggests the existence o
f a change from bridge to linearly bonded NO as the electrode potentia
l increases. Parallel voltammetric experiments allowed the determinati
on of the surface coverage.