Hf diffusion coefficients (D) have been measured (similar to 870-1100
K) in directions parallel (D-pa) and perpendicular (D-pe) to the c-axi
s of double-faced, single-crystal specimens of both high purity (HP) a
nd nominally pure (NP) alpha-Zr. The diffusion profiles were measured
by secondary ion mass spectrometry. Hf diffusion in HP alpha-Zr is cha
racterised by an activation energy of about 3.0 eV and a pre-exponenti
al factor of about 10(-5) m(2)/s. The anisotropy ratio, D-pa/D-pe, is
similar to < 1.0 for the HP specimens and mostly > 1.0 for the NP spec
imens. A dependence of D on diffusion time/depth is indicated for some
experiments on NP Zr.