The residual stress states in a naturally grown titanium oxide layer a
nd its underlying substrate have been studied with X-ray diffraction.
All three natural oxides (rutile, anatase and brookite) were found in
the oxide. The residual stress has been determined for the rutile phas
e using a numerical sin(2) psi analysis and compared with the stress s
tate in the hexagonal alpha-phase of the Ti6Al4V alloy substrate.