ACCURATE DE-EMBEDDING TECHNIQUE FOR ON-CHIP SMALL-SIGNAL CHARACTERIZATION OF HIGH-FREQUENCY OPTICAL MODULATOR

A simple and accurate de-embedding technique has been developed for ch aracterizing the microwave circuit behavior of noninsertable multiple quantum well waveguide modulators with on-chip two-port S-parameter me asurements. The small-signal equivalent circuit parameters extracted f rom the error-corrected modulation response show an excellent agreemen t with both one-port microwave reflection coefficient measurement and CV data measured at 1 MHz.