J. Jaroszynski et al., DIMENSIONAL CROSSOVERS IN MAGNETORESISTANCE OF SUBMICRON FILMS AND WIRES OF CDTE-IN, Acta Physica Polonica. A, 90(5), 1996, pp. 1027-1031
We present millikelvin studies of magnetoresistance for epitaxial film
s and wires of CdTe:In. In comparison to the data, with theoretical pr
edictions for the weakly localized regime we put into the evidence the
presence of the temperature-induced dimensional crossovers in the stu
died systems. Our measurements probe the electron phase-breaking rate
and indicate that the main dephasing mechanism arises from electron sc
attering from thermal fluctuations of three- or two-dimensional electr
on liquid.