Sw. Reeve et al., ON THE OPTIMIZATION OF A DC ARCJET DIAMOND CHEMICAL-VAPOR-DEPOSITION REACTOR, Journal of materials research, 11(3), 1996, pp. 694-702
Based on results from chemical kinetic model calculations, a method to
improve diamond film growth in a de arcjet chemical vapor deposition
reactor has been developed. Introducing the carbon source gas (CH4) in
to an Ar/H-2 plasma in close proximity to the substrate produced diamo
nd films exhibiting simultaneous improvements in quality and mass depo
sition rates. These improvements result from a reduced residence time
of the methane in the plasma which inhibits the hydrocarbon chemistry
in the gas from proceeding significantly beyond methyl radical product
ion prior to encountering the substrate, Improvements in growth rate w
ere modest, increasing by only a factor of two. Optical emission actin
ometry measurements indicate that the flux of atomic hydrogen across t
he stagnation layer to the substrate is mass diffusion limited. Since
diamond growth depends upon the flux of atomic H to the substrate, the
se results suggest that under the conditions examined here, a low atom
ic H flux to the substrate poses an upper limit on the attainable diam
ond growth rate.