MBE GROWTH AND PROPERTIES OF ZNYBTE LAYERS

The MBE grown ZnYbTe layers were characterized by X-ray diffraction, p hotoluminescence and reflectivity measurements. The MBE growth conditi ons allowing to obtain monocrystalline ZnYbTe layers were found to be metal-rich (MBE growth with excess of Zn flux). In optical measurement s (photoluminescence, reflectivity), both transitions connected with t ernary ZnYbTe compound and with Yb3+ ions were detected. The quality o f ZnYbTe layers with Yb content of 3% and 1% is inferior to the qualit y of pure ZnTe MBE layers, which is clearly seen in the results of pho toluminescence and reflectivity measurements. In the ZnYbTe layers wit h 3% Yb, exhibiting monocrystalline character in reflection high-energ y electron diffraction and X-ray diffraction measurements, optical tra nsitions characteristic of pure YbTe were detected. In ZnYbTe layers w ith 1% Yb, no transitions connected with YbTe were observed.