Me. Ozsan et al., OPTICAL AND ELECTRICAL CHARACTERIZATION OF CDS THIN-FILMS, Journal of materials science. Materials in electronics, 7(2), 1996, pp. 119-125
Thin CdS films have been grown by chemical bath (CdCl2, thiourea, ammo
nia) deposition (CBD) on SnO2 (TO)-coated glass substrate for use as w
indow materials in CdS/CdTe solar cells. High-resolution transmission
electron microscopy revealed grains with an average size of 10 nm. The
structure was predominantly hexagonal with a high density of stacking
faults. The film crystallinity improved with annealing in air. Anneal
ing in a CdCl2 flux increased the grain size considerably and reduced
the density of stacking faults. The optical transmission of the as-dep
osited films indicated a band gap energy of 2.41 eV. Annealing in air
reduced the band gap by 0.1 eV. Annealing in CdCl2 led to a sharper op
tical absorption edge that remained at 2.41 eV. Similar band gap value
s were obtained by photocurrent spectroscopy and electroabsorption spe
ctroscopy (EEA) using an electrolyte contact. EEA spectra were broad f
or the as-deposited and air-annealed samples, but narrower for the CdC
l2-annealed films, reflecting the reduction in stacking fault density.
Donor densities of ca. 10(17) cm(-3) were derived from the film/elect
rolyte junction capacitance.